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Research on Defect Detection of Insulators Based on Improved ACR-YOLO
Graphic and Image Processing | 更新时间：2025-09-30

    • Research on Defect Detection of Insulators Based on Improved ACR-YOLO

    • “In the field of insulator defect detection, experts have proposed a target defect detection algorithm based on improved ACR-YOLO, which effectively improves detection accuracy and speed.”
    • Software Guide   Vol. 24, Issue 9, Pages: 181-188(2025)

    • DOI：10.11907/rjdk.241648    

      CLC： TP391

    • Received：30 July 2024，

      Published：15 September 2025

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  • HAN Ming,ZHANG Zhaokun,YU Pingping,et al.Research on Defect Detection of Insulators Based on Improved ACR-YOLO[J].Software Guide,2025,24(09):181-188. DOI： 10.11907/rjdk.241648.

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